Application of the Double Slit Interferometer to the Measurement of Phase Shift of Light Transmitted through Thin Films
- 15 May 1950
- journal article
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 5 (3) , 187-192
- https://doi.org/10.1143/jpsj.5.187
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Über spezifischen Widerstand und optische Konstanten dünner MetallschichtenAnnalen der Physik, 1916