Fluorescence spectroscopy and transmission electron microscopy of the same isolated semiconductor nanocrystals

5 August 2002

journal article
Published by AIP Publishing in Applied Physics Letters

Vol. 81 (6) , 1116-1118
https://doi.org/10.1063/1.1499221

Abstract

We present a method to establish a correlation between the crystalline structure and the fluorescence properties of isolated semiconductor nanocrystals. By using ultrathin silicon nitride substrates with markers, we have localized and investigated the same particles in both a high-resolution transmission electron microscope (TEM) and a confocal optical microscope. We have found that the observation of strong fluorescence emission does not require single domain particles. Additionally, we have correlated the size and shape of a particle as determined by TEM and its spectral properties like emission wavelength and spectral diffusion.

Keywords

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