Convergent Beam Electron Diffraction and Transmission Electron Microscopy Study of Interfacial Defects in Gallium Nitride Homoepitaxial Films
- 1 August 1997
- journal article
- research article
- Published by Oxford University Press (OUP) in Microscopy and Microanalysis
- Vol. 3 (5) , 436-442
- https://doi.org/10.1017/s1431927697970331
Abstract
Convergent Beam Electron Diffraction and Transmission Electron Microscopy Study of Interfacial Defects in Gallium Nitride Homoepitaxial FilmsKeywords
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