UBIST version of the SYCO's control section compiler
- 1 January 1988
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 392-396
- https://doi.org/10.1109/iccd.1988.25730
Abstract
ISBN: 0818608722The authors describe a design-for-testability strategy for the SYCO control section compiler (CPC). The SYCO CPC translates high-level descriptions into mask-level specification for hierarchical control sections, which are composed of a stack of control section slices, each one organized around a programmable logic array. The proposed design-for-testability scheme is called UBIST (unified built-in self-test) and ensures a high quality for all tests needed for integrated circuits (i.e. online and offline tests). The authors elucidate the concept of UBIST and show how to modify SYCO CPC data structure and its automatic layout synthesizer to generate UBIST control sections automatically and efficientlyKeywords
This publication has 5 references indexed in Scilit:
- Multiple stuck-at fault testability of self-testing checkersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Strongly code disjoint checkersIEEE Transactions on Computers, 1988
- Principles of the SYCO compilerPublished by Association for Computing Machinery (ACM) ,1986
- Strongly Fault Secure Logic NetworksIEEE Transactions on Computers, 1978
- Primitive Polynomials (Mod 2)Mathematics of Computation, 1962