Experimental analysis of Ag+-Na+ exchange in glass with Ag film ion sources for planar optical waveguide fabrication
- 1 February 1988
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 63 (3) , 634-639
- https://doi.org/10.1063/1.340103
Abstract
A detailed experimental analysis of Ag+‐Na+ ion exchange in glass using Ag films as ion sources for the fabrication of planar optical waveguides has been performed. The refractive index profiles of the waveguides have been measured and compared to the theoretical Ag+ concentration profiles. The theoretically predicted special characteristics of the process are verified and the material parameters of the used substrate glass (Corning 0211) are evaluated.This publication has 14 references indexed in Scilit:
- Fabrication of ion-exchanged channel waveguides directly into integrated circuit mask platesApplied Physics Letters, 1987
- Control of ion-exchanged waveguide profiles with Ag thin-film sourcesJournal of Applied Physics, 1987
- Ion exchange process for fabrication of waveguide couplers for fiber optic sensor applicationsJournal of Applied Physics, 1987
- Stress in ion-exchanged glass waveguidesJournal of Lightwave Technology, 1986
- Glass Waveguides By Ion Exchange: A ReviewOptical Engineering, 1985
- Construction of refractive-index profiles of planar dielectric waveguides from the distribution of effective indexesJournal of Lightwave Technology, 1985
- Planar waveguide refractive-index profiling using modal intensity distributionsApplied Optics, 1982
- Analysis of Field‐Assisted Binary Ion ExchangeJournal of the American Ceramic Society, 1979
- Optical waveguides fabricated by electric-field controlled ion exchange in glassElectronics Letters, 1978
- Theory of Prism–Film Coupler and Thin-Film Light GuidesJournal of the Optical Society of America, 1970