A simple soft X-ray (1 < λ < 11 nm) spectrometer for relative line intensity measurements in charge exchange studies
- 1 March 1986
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 14 (3) , 353-359
- https://doi.org/10.1016/0168-583x(86)90605-1
Abstract
No abstract availableKeywords
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