OPTICAL AND X-RAY INTERFEROMETRY OF A SILICON LATTICE SPACING
- 1 December 1969
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 15 (11) , 386-388
- https://doi.org/10.1063/1.1652870
Abstract
A device permitting simultaneous x-ray and optical interferometry over traverses in excess of 20 μm is reported. Results obtained to date suggest that such devices will permit measurements of certain crystal-lattice spacings with accuracies better than one part per million.Keywords
This publication has 4 references indexed in Scilit:
- A two-crystal X-ray interferometerThe European Physical Journal A, 1968
- Gas Density Stabilizer for Flow Proportional CountersReview of Scientific Instruments, 1966
- AN X-RAY INTERFEROMETER WITH LONG SEPARATED INTERFERING BEAM PATHSApplied Physics Letters, 1965
- An Electron InterferometerReview of Scientific Instruments, 1954