A new concept silicon homojunction infrared sensor

• 6 January 2003
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 82-85
• https://doi.org/10.1109/iedm.1988.32756

Abstract

Keywords

• IMAGE SENSORS
• OPERATION
• INFRARED ABSORPTION
• CUTOFF WAVELENGTH
• FREE ELECTRONS
• CONDUCTION BAND
• SEMICONDUCTORS
• SILICON