Abstract
We have grown Ba1-xSrx TiO3 crystals by a slow cooling process with KF as a flux. Differences have been observed between the x Strontium concentration in the melt and in the crystal. Hence it follows that x (strontium) evolutes from core to surface of the crystal.We provide proof of concentric distribution of Sr concentration by the direct observation using polarization microscope and by electronic microanalysis measurements.We propose a discrete layers model to explain the dulling and the broadening of the dielectric constant peak at the Curie temperature. Characterizing the sharpness of this peak as the band pass of an amplifier, we observe that it undergoes a pseudo-linear change with dispersion Δx of the Sr concentration in the sample.Miscellaneous experimental results are given.

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