Power semiconductors empirical diagrams expressing life as a function of temperature excursion
- 1 January 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 29 (1) , 517-522
- https://doi.org/10.1109/20.195629
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Thermal Stress and Low Cycle FatigueJournal of Applied Mechanics, 1966