Dielectric Measurements Using Swept Frequency Techniques*

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Abstract
A swept-frequency dielectric measurement technique is presented which is shown to have advantages over conventional techniques in that it can yield more information about the sample under test. The method of measurement is described, and the various theoretical relations are derived. Some experimental results are given and compared with exact computer solutions, which show the method to have a basic accuracy of better than 5%, depending on the material under test. A graphical solution to one of the equations is given. A brief outline is given of further extensions of this method to be published in greater detail in a later paper.

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