Ultra-smooth, highly ordered, thin films of La0.67Ca0.33MnO3±d

Abstract
We report the growth and characterization of ultra‐smooth, highly ordered, strained La2/3Ca1/3MnOd thin films (approximately 600 Å in thickness). The thin films were deposited by ozone‐assisted, block‐by‐block, molecular beam epitaxy on SrTiO3 (001) substrates without any post‐deposition annealing. Scanning tunneling microscopy images showed oriented, unit‐cell‐high terraces characteristic of a step‐flow growth mechanism. The root‐mean‐square roughness of the surface of an imaged film was determined to be 2 Å. This same film showed negative magnetoresistance values, [R(H=0)−R(Happlied)]/R(H=0), at 150 K of 93% and 5% in applied magnetic fields of 5.12 and 4×10−2 T, respectively.

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