Vibrational Raman and infrared studies of ordering in epitaxialZnSnP2

Abstract
We report a Raman-scattering and infrared (IR) reflectivity investigation of chalcopyrite (ordered) and sphalerite (disordered) ZnSnP2 grown by gas-source molecular-beam epitaxy on (001) GaAs substrates. Variation in the ZnSnP2 structure was obtained by controlling the Sn/Zn flux ratio during growth. Experimental results are compared with extensive calculations of the vibrational structure for the ordered ZnSnP2. The rigid-ion model is used to obtain lattice-dynamical properties, and the bond polarizability model was used for calculation of Raman tensor components. The model predicts a strong dependence of Raman intensity of Γ1 and Γ3 modes on tetrahedral distortion of chalcopyrite structure. For the ordered ZnSnP2 films (0.01% lattice mismatch with the substrate) we observed several narrow (25cm1) Raman and IR lines in the 290320cm1 range. Using Raman and IR selection rules for c orientation of the growth axis and lattice-dynamical calculations, we identify Γ1, Γ3, 2Γ4L, and 3Γ5T,L modes. For the disordered sphalerite ZnSnP2 films (+0.1% lattice mismatch with the substrate) we observed much broader features (1025cm1) consisting of two IR-active polar Γ15 modes and four nonpolar Γ1 modes. We assign the nonpolar modes to allowed (Γ1,Γ3) and forbidden (2Γ2) vibrations of chalcopyrite-type phase (nanocrystals) in a disordered matrix. Using spatial correlation model the average nanocrystal size is estimated to be 70 nm. The spectra of the films of intermediate lattice mismatch are well described by a superposition of the spectra of the ordered and disordered ZnSnP2.