Vibrational Raman and infrared studies of ordering in epitaxial
- 15 June 1999
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 59 (23) , 15197-15207
- https://doi.org/10.1103/physrevb.59.15197
Abstract
We report a Raman-scattering and infrared (IR) reflectivity investigation of chalcopyrite (ordered) and sphalerite (disordered) grown by gas-source molecular-beam epitaxy on (001) GaAs substrates. Variation in the structure was obtained by controlling the Sn/Zn flux ratio during growth. Experimental results are compared with extensive calculations of the vibrational structure for the ordered . The rigid-ion model is used to obtain lattice-dynamical properties, and the bond polarizability model was used for calculation of Raman tensor components. The model predicts a strong dependence of Raman intensity of and modes on tetrahedral distortion of chalcopyrite structure. For the ordered films lattice mismatch with the substrate) we observed several narrow Raman and IR lines in the range. Using Raman and IR selection rules for c orientation of the growth axis and lattice-dynamical calculations, we identify and modes. For the disordered sphalerite films lattice mismatch with the substrate) we observed much broader features consisting of two IR-active polar modes and four nonpolar modes. We assign the nonpolar modes to allowed and forbidden vibrations of chalcopyrite-type phase (nanocrystals) in a disordered matrix. Using spatial correlation model the average nanocrystal size is estimated to be nm. The spectra of the films of intermediate lattice mismatch are well described by a superposition of the spectra of the ordered and disordered .
Keywords
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