Grain Size Dependence of the Gauge Factor of Thin Metallic Films
Open Access
- 1 January 1977
- journal article
- research article
- Published by Wiley in Active and Passive Electronic Components
- Vol. 4 (1) , 9-17
- https://doi.org/10.1155/apec.4.9
Abstract
The combined effects of grain boundary, external surface and background scattering (Mayadas and Shatzkes model) are considered. Theoretical expressions of the transverse and longitudinal strain coefficient of resistance of monocrystalline and polycrystalline films are calculated. These general formulae agree with those previously proposed for infinitely thick polycrystalline films.Keywords
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