Scaling Behavior of Self-Avoiding Random Surfaces

Abstract
Self-avoiding random surfaces are analyzed by renormalization-group methods. The Hausdorff dimension 1ν and the critical plaquette fugacity are computed for different dimensionalities d; in particular, ν=12ε4+O(ε2) for d=2+ε. The model describes "sheet polymers" in a good solvent: A Flory type of argument yields ν=3(4+d), in good agreement with the renormalization results, and a critical dimensionality dc=8, with ν=14.