Method for the direct measurement of y -, z -, h - and g -parameters at microwave frequencies

20 July 1978

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 14 (15) , 455-456
https://doi.org/10.1049/el:19780305

Abstract

A new measurement technique is presented that uses a modification of standard S-parameter instrumentation to directly measure y-,z-,h- andg-parameters at microwave frequencies. The required open-circuit and short-circuit terminations are created by the appropriate simultaneous application of the test r.f. signal to both ports of the device under test. Experimental results indicate the possibility of using this approach to improve the accuracy of 2-port characterisations at microwave frequencies.

Keywords

This publication has 1 reference indexed in Scilit:

A New Load-Pull Characterization Method for Microwave Power Transistors
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005