Degradation mechanism at XLPE/semicon interface subjected to high electrical stress
- 1 April 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electrical Insulation
- Vol. 26 (2) , 278-284
- https://doi.org/10.1109/14.78329
Abstract
Peer reviewed: NoNRC publication: YeKeywords
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