Direct measurement of infrared photo-elastic constants of silicon
- 1 January 1967
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 3 (1) , 31-32
- https://doi.org/10.1109/jqe.1967.1074360
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- AN ACOUSTIC LIGHT MODULATOR FOR 10.6 μApplied Physics Letters, 1966
- A NEW TECHNIQUE FOR MEASURING MAGNITUDES OF PHOTOELASTIC TENSORS AND ITS APPLICATION TO LITHIUM NIOBATEApplied Physics Letters, 1966
- Measurement of light-sound interaction efficiencies in solidsIEEE Journal of Quantum Electronics, 1965
- Wide-Band Modulation of a Laser Beam, Using Bragg-Angle Diffraction by Amplitude-Modulated Ultrasonic WavesThe Journal of the Acoustical Society of America, 1965
- Acoustic Beam Probing Using Optical TechniquesBell System Technical Journal, 1965
- Interaction of light and microwave soundProceedings of the IEEE, 1965
- Diffraction of light by ultrasonic waves I. General theoryProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1953