X-ray intensity measurements on large crystals by energy-dispersive diffractometry. IV. Determination of anomalous scattering factors near the absorption edges of GaAs by the one-intensity-ratio method
- 1 September 1979
- journal article
- Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A
- Vol. 35 (5) , 828-831
- https://doi.org/10.1107/s056773947900187x
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