Soft-x-ray emission and inelastic electron-scattering study of the electronic excitations in amorphous and crystalline silicon dioxide
- 15 September 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 38 (8) , 5547-5553
- https://doi.org/10.1103/physrevb.38.5547
Abstract
No abstract availableKeywords
This publication has 28 references indexed in Scilit:
- Soft-x-ray emission spectroscopy study of the electronic structure of nonstoichiometric silicon nitridePhysical Review B, 1987
- Electronic structure of crystalline and amorphous silicon dioxidePhysical Review B, 1985
- New soft x-ray emission spectrographReview of Scientific Instruments, 1984
- Electronic structure of Si:-quartz and the influence of local disorderPhysical Review B, 1980
- Bulk electronic structure of SiPhysical Review B, 1979
- X-ray photoelectron spectroscopy of silica in theory and experimentJournal of Non-Crystalline Solids, 1976
- Electronic structure, spectra, and properties of 4:2-coordinated materials. I. Crystalline and amorphousandPhysical Review B, 1976
- Inelastic electron scattering spectrometerReview of Scientific Instruments, 1975
- Electronic structure of Si. I. Theory and sample calculationsPhysical Review B, 1974
- X-ray photoelectron, X-ray emission and UV spectra of SiO2 calculated by the SCF Xα scattered wave methodChemical Physics Letters, 1973