Influence of an initial (contamination) film on the determination of film properties by ellipsometry
- 1 May 1975
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 65 (5) , 611-612
- https://doi.org/10.1364/josa.65.000611
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 2 references indexed in Scilit:
- Effect of a Thin Surface Film on the Ellipsometric Determination of Optical Constants*Journal of the Optical Society of America, 1964
- Determination of the Properties of Films on Silicon by the Method of EllipsometryJournal of the Optical Society of America, 1962