Filamentary Conduction in VO2 Coplanar Thin-Film Devices

15 August 1971

journal article
Published by AIP Publishing in Applied Physics Letters

Vol. 19 (4) , 115-117
https://doi.org/10.1063/1.1653835

Abstract

Filaments have been observed in VO₂ coplanar thin‐film devices and their I‐V characteristic investigated. An analysis of the evolution of the temperature profile in the VO₂ film is given.

Keywords

THIN FILM

This publication has 5 references indexed in Scilit:

A thin-film inductance using thermal filaments
IEEE Transactions on Electron Devices, 1970
Observation of filament formation in amorphous films during switching
Thin Solid Films, 1970
Current Filaments in Semiconductors
IBM Journal of Research and Development, 1969
Characteristics of Semiconducting Glass Switching/Memory Diodes
IBM Journal of Research and Development, 1969
Thermal filaments in vanadium dioxide
IEEE Transactions on Electron Devices, 1969