Eigen light-fields and face recognition across pose
- 25 June 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
In many face recognition tasks the pose of the probe and gallery images are different. In other cases multiple gallery or probe images may be available, each captured from a different pose. We propose a face recognition algorithm which can use any number of gallery images per subject captured at arbitrary poses, and any number of probe images, again captured at arbitrary poses. The algorithm operates by estimating the eigen light-field of the subject's head from the input gallery or probe images. Matching between the probe and gallery is then performed using the eigen light-fields. We present results on the CMU PIE and the FERET face databases.Keywords
This publication has 15 references indexed in Scilit:
- The CMU Pose, Illumination, and Expression (PIE) databasePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- The quotient image: Class based recognition and synthesis under varying illumination conditionsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Face recognition using eigenfacesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Vision in bad weatherPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1999
- The FERET database and evaluation procedure for face-recognition algorithmsImage and Vision Computing, 1998
- What Is the Set of Images of an Object Under All Possible Illumination Conditions?International Journal of Computer Vision, 1998
- Linear object classes and image synthesis from a single example imagePublished by Institute of Electrical and Electronics Engineers (IEEE) ,1997
- The lumigraphPublished by Association for Computing Machinery (ACM) ,1996
- Visual learning and recognition of 3-d objects from appearanceInternational Journal of Computer Vision, 1995
- View-based and modular eigenspaces for face recognitionPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1994