Bipolar MOS power device simulator TonaddeIIc taking into account external circuit
- 25 August 2005
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
First Page of the Article Author(s) Nakagawa, A. Toshiba R&D Center Sato, K.Keywords
This publication has 1 reference indexed in Scilit:
- Field-dependent mobility model for two-dimensional numerical analysis of MOSFET'sIEEE Transactions on Electron Devices, 1979