Electrical Properties of Grain Boundaries in the Presence of Deep Bulk Traps
- 1 January 1985
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Admittance spectroscopy of impurity levels in Schottky barriersJournal of Applied Physics, 1975
- Frequency dependence of C and ΔV/Δ(C−2) of Schottky barriers containing deep impuritiesSolid-State Electronics, 1973
- Admittance of p-n junctions containing trapsSolid-State Electronics, 1972