Level based on moiré deflectometry
- 1 November 1982
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 53 (11) , 1779-1781
- https://doi.org/10.1063/1.1136859
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Reflective surface analysis using moiré deflectometryApplied Optics, 1981
- Noncoherent method for mapping phase objectsOptics Letters, 1980