High resolution studies of the electronic decay of core holes in molecules: there is no threshold at the “XPS threshold”
- 26 October 1994
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 69 (3) , 239-244
- https://doi.org/10.1016/0368-2048(94)02198-9
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Soft x-ray spectroscopy beam line on the NSLS X1 undulator: Optical design and first performance testsReview of Scientific Instruments, 1992
- Unified Theory of Auger Electron EmissionPhysica Scripta, 1992
- Recent Advances in Studies of the Electronic Decay of Core Excited States in Small MoleculesPhysica Scripta, 1992
- High-resolutionK-shell photoabsorption measurements of simple moleculesPhysical Review A, 1991
- An analysis of local and gradient-corrected correlation energy functionals using electron removal energiesJournal of Physics B: Atomic, Molecular and Optical Physics, 1989
- Post-collision interaction and the Auger lineshapeJournal of Physics B: Atomic and Molecular Physics, 1986
- Deexcitation Electron Spectroscopy: A Probe for the Localisation of Valence Wavefunctions in Free and Adsorbed MoleculesAustralian Journal of Physics, 1986
- Analysis of post-collision interactions in Auger processes following near-threshold inner-shell photoionizationJournal of Physics B: Atomic and Molecular Physics, 1977
- Accurate core ionization potentials and photoelectron kinetic energies for light elementsJournal of Electron Spectroscopy and Related Phenomena, 1974
- Sur l'effet photoélectrique composéJournal de Physique et le Radium, 1925