A reliability report on low power TTL integrated circuits

• 1 April 1972
• journal article
• Published by Elsevier in Microelectronics Reliability
• Vol. 11  (2) , 171-175
• https://doi.org/10.1016/0026-2714(72)90699-3

Abstract

Keywords

• LOW POWER
• INTEGRATED CIRCUITS
• TTL INTEGRATED
• POWER TTL
• RELIABILITY REPORT