Measurement of the Characteristics of Magnetic Thin Film Matrices
- 1 November 1962
- journal article
- electronic section
- Published by Taylor & Francis in Journal of Electronics and Control
- Vol. 13 (5) , 425-435
- https://doi.org/10.1080/00207216208937449
Abstract
Methods are described for the measurement of the parameters of thin magnetic films exhibiting uniaxial anisotropy. Pulse apparatus is described which enables these measurements to be made on each film of a matrix. The application of such measurements to the assessment of a matrix for use in a computer store is discussed.Keywords
This publication has 2 references indexed in Scilit:
- The Importance of Secondary Effects when Measuring Thin Film Anisotropy Fields (Hk)Journal of Electronics and Control, 1962
- Measurement of Easy Direction Dispersion in Magnetic Thin FilmsNature, 1962