SiSiO2 interface characterization by ESCA
- 1 June 1979
- journal article
- Published by Elsevier in Surface Science
- Vol. 84 (2) , 355-374
- https://doi.org/10.1016/0039-6028(79)90142-0
Abstract
No abstract availableThis publication has 31 references indexed in Scilit:
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