Pattern classification using self-organizing feature maps
- 1 January 1990
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- An introduction to computing with neural netsIEEE ASSP Magazine, 1987
- A Comparative Study of Texture Measures for Terrain ClassificationIEEE Transactions on Systems, Man, and Cybernetics, 1976