Optical parameters of partially transmitting thin films 2: Experiment and further analysis of a novel method for their determination
- 1 January 1976
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 15 (1) , 120-126
- https://doi.org/10.1364/ao.15.000120
Abstract
In Part 1 of this work a theory was developed for the measurement of the thickness, refractive index, and absorption coefficient of a partially transmitting thin film. In the present work, an experimental system is described and the basic theory verified by actual measurements. It is shown how the measurement of intensity ratios in a single setup is adequate for the determination of the above mentioned parameters. In addition, the application of the system for the examination of optical surface quality is demonstrated. Finally, the theory is extended to nonnormal incidence.Keywords
This publication has 1 reference indexed in Scilit:
- Reflectance and Ellipsometry When Submicroscopic Particles Bestrew a Surface*Journal of the Optical Society of America, 1970