Observation of Final-State Screening in Inverse Photoemission from Adsorbed Xenon Layers
- 25 August 1986
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 57 (8) , 1064-1067
- https://doi.org/10.1103/physrevlett.57.1064
Abstract
Inverse photoemission spectra of xenon layers adsorbed on Au(110) have been recorded. The unoccupied levels of xenon exhibit layer-dependent peak shifts to higher energies. The level of the second xenon layer is shifted by 0.65 eV relative to the monolayer energy, with the level exhibiting a 0.85-eV shift. These shifts are related to the image-charge screening of the negative-ion inverse-photoemission-spectra final states. This observation demonstrates the influence of screening in inverse photoemission, and provides a test of the different conflicting models put forward in explanation of such shifts.
Keywords
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