Abstract
Steady-state one-carrier and two-carrier space-charge-limited currents (SCLC) and emission-limited currents were observed in amorphous selenium films ranging in thickness from 0.83 to 42 μm. Above a threshold VL21.5×107 V/cm2 and below an upper limit of VL25×108 V/cm2 relating the applied voltage V and the film thickness L, the trap-free insulator model accounts for both the one-carrier and the two-carrier SCLC and yields the values θp=6.3×107 and θn=2.5×106 for the ratios of free to trapped holes and electrons, respectively, and τ1 sec for the effective carrier recombination time.