A refined procedure for the determination of the layer charge with alkylammonium ions
- 1 September 1988
- journal article
- Published by Mineralogical Society in Clay Minerals
- Vol. 23 (3) , 333-337
- https://doi.org/10.1180/claymin.1988.023.3.11
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Standard Reference Materials for X-Ray Diffraction Part I. Overview of Current and Future Standard Reference MaterialsPowder Diffraction, 1986
- The determination of layer charge by curve-fitting of Lorentz- and polarization-corrected X-ray diagramsClay Minerals, 1986
- Layer Charge Heterogeneity in VermiculitesClays and Clay Minerals, 1982
- Anordnung und Orientierung kationischer Tenside auf SilicatoberflächenColloid and Polymer Science, 1970