AES and SAM studies of oxide formation on Inconel 600 at high temperatures

This publication has 9 references indexed in Scilit:

• Diffusion of cations in chromia layers grown on iron-base alloys
  Oxidation of Metals, 1992
• Application of environmental electron spectroscopy to AES of bulk ceramics
  Surface and Interface Analysis, 1991
• Characterization of oxide structures formed on nickel-chromium alloy during low pressure oxidation at 500?600 C
  Oxidation of Metals, 1990
• Oxidation of NiCr and NiCrFe alloys at room temperature
  Surface and Interface Analysis, 1988
• Oxidation of Ni-base alloys in atmospheres with widely varying oxygen partial pressures
  Oxidation of Metals, 1986
• The ultra-high resolution depth profiling reference material — Ta2O5 anodically grown on Ta
  Surface Science, 1984
• Characterization of a high depth‐resolution tantalum pentoxide sputter profiling reference material
  Surface and Interface Analysis, 1983
• XPS study of the initial growth of oxide films on Inconel 600 alloy
  Applications of Surface Science, 1978
• Oxidation of Ni-Cr-Al Alloys Between 1000° and 1200°C
  Journal of the Electrochemical Society, 1971