C-mode acoustic microscopy applied to integrated circuit package inspection
- 1 March 1992
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 35 (3) , 411-421
- https://doi.org/10.1016/0038-1101(92)90245-8
Abstract
No abstract availableKeywords
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- Integrated circuits as viewed with an acoustic microscopeApplied Physics Letters, 1974