Investigation of edge effect from the chip-back temperature using IR thermographic techniques
- 31 July 1995
- journal article
- Published by Elsevier in Journal of Materials Processing Technology
- Vol. 52 (2) , 213-224
- https://doi.org/10.1016/0924-0136(94)01608-4
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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