Radiation characterization of a 28C256 EEPROM
- 1 December 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 36 (6) , 2247-2251
- https://doi.org/10.1109/23.45431
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Prediction of Dose to Failure versus Dose Rate for a Recessed Oxide Digital Bipolar MicrocircuitIEEE Transactions on Nuclear Science, 1987
- Total-Dose Failure Mechanisms of Integrated Circuits in Laboratory and Space EnvironmentsIEEE Transactions on Nuclear Science, 1987
- Total-Dose Radiation and Annealing Studies: Implications for Hardness Assurance TestingIEEE Transactions on Nuclear Science, 1986