Electrochemical Observation of a Metal/Insulator Transition by Scanning Electrochemical Microscopy
- 17 July 2001
- journal article
- research article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry B
- Vol. 105 (31) , 7474-7476
- https://doi.org/10.1021/jp010970o
Abstract
No abstract availableKeywords
This publication has 36 references indexed in Scilit:
- On Electronic Properties of Assemblies of Quantum NanodotsThe Journal of Physical Chemistry A, 2000
- Lateral Proton Diffusion Rates along Stearic Acid MonolayersJournal of the American Chemical Society, 2000
- Diode-like electron transfer across nanostructured films containing a redox ligandJournal of Materials Chemistry, 1999
- Scanning Electrochemistry Microscopy (SECM) in the Study of Electron Transfer Kinetics at Liquid/Liquid Interfaces: Beyond the Constant Composition ApproximationThe Journal of Physical Chemistry B, 1999
- Using Electrons Stored on Quantized Capacitors in Electron Transfer ReactionsJournal of the American Chemical Society, 1999
- Scanning Electrochemical Microscopy (SECM): An Investigation of the Effects of Tip Geometry on Amperometric Tip ResponseThe Journal of Physical Chemistry B, 1998
- Assembly and Self-Organization of Silver Nanocrystal Superlattices: Ordered “Soft Spheres”The Journal of Physical Chemistry B, 1998
- Networks of Quantum Nanodots: The Role of Disorder in Modifying Electronic and Optical PropertiesThe Journal of Physical Chemistry B, 1998
- Fabrication and Alignment of Wires in Two DimensionsThe Journal of Physical Chemistry B, 1998
- Scanning Electrochemical Microscopy. 34. Potential Dependence of the Electron-Transfer Rate and Film Formation at the Liquid/Liquid InterfaceThe Journal of Physical Chemistry, 1996