Semiconductor analog of scanning cathode-ray tube
- 1 January 1971
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
- Vol. 59 (2) , 318-319
- https://doi.org/10.1109/PROC.1971.8161
Abstract
A silicon structure in which a photoexcited electron beam is electrically deflected over an included angle of 22° has been used to detect a one-dimensional optical image extending 100 µm. Five points of resolution were obtained; this is close to a theoretical estimate based on diffusion-controlled beam spreading.Keywords
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