Determination of trace elements in semiconductor materials by neutron activation analysis using the radioisotope addition technique
- 1 November 1984
- journal article
- Published by Springer Nature in Journal of Radioanalytical and Nuclear Chemistry
- Vol. 84 (2) , 291-300
- https://doi.org/10.1007/bf02036968
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Instrumental neutron activation analysis of semiconductor grade siliconJournal of Radioanalytical and Nuclear Chemistry, 1979
- The selective removal of32P from activated specimens in neutron activation analysisJournal of Radioanalytical and Nuclear Chemistry, 1970