Formation of secondary cluster ions during sputtering of silver and copper
- 15 June 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 43 (18) , 14396-14399
- https://doi.org/10.1103/physrevb.43.14396
Abstract
By simultaneous measurements of neutral and ionized clusters sputtered from polycrystalline silver and copper, the absolute ionization probabilities for the formation of the corresponding secondary ions (n=1,...,4) are determined. The alternating abundance of and is discussed quantitatively in terms of microscopic models for surface ionization. At least for silver clusters this effect is ascribed to an alternation of the ionization probability induced by the different ionization potentials of the sputtered clusters, which were also measured.
Keywords
This publication has 33 references indexed in Scilit:
- Energy spectrum of a 2D Dirac electron in the presence of a constant magnetic fieldZeitschrift für Physik B Condensed Matter, 2001
- Experimental studies of gas-phase main-group metal clustersChemical Reviews, 1988
- Unimolecular Decomposition of Sputtered,, andClustersPhysical Review Letters, 1986
- Mass distributions of copper, silver and gold clusters and electronic shell structureInternational Journal of Mass Spectrometry and Ion Processes, 1985
- Electron impact ionization cross sections of phosphorus and arsenic moleculesJournal de Physique, 1984
- Secondary-ion emission probability in sputteringPhysical Review B, 1979
- Energy distributions of neutral atoms and molecules sputtered from polycrystalline silverNuclear Instruments and Methods, 1976
- Mass spectrometry of neutral molecules sputtered from polycrystalline metals by Ar+-ions of 100?1000 eVZeitschrift für Physik B Condensed Matter, 1975
- Electron-impact ionization cross-sections for atoms up to Z=108The European Physical Journal A, 1970
- Cross-sections of Molecules for Ionization by ElectronsJournal of the American Chemical Society, 1956