Electron detection EXAFS in He and vacuum
- 1 June 1989
- journal article
- Published by Elsevier in Physica B: Condensed Matter
- Vol. 158 (1-3) , 295-298
- https://doi.org/10.1016/0921-4526(89)90290-1
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Depth dependence for extended x-ray-absorption fine-structure spectroscopy detected via electron yield in He and in vacuumPhysical Review B, 1988
- Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structurePhysical Review B, 1988
- Extended x-ray-absorption fine structure: Direct comparison of absorption and electron yieldPhysical Review B, 1985
- Electron-yield extended x-ray absorption fine structure with the use of a gas-flow electron detectorPhysical Review B, 1984
- High-pass photocathode x-ray ionization chamber for surface EXAFSReview of Scientific Instruments, 1979
- Relaxation effects on auger energiesChemical Physics Letters, 1972