Contrast in the electron spectroscopic imaging mode of a TEM. I. Influence of zero‐loss filtering on scattering contrast
- 2 August 1989
- journal article
- research article
- Published by Wiley in Journal of Microscopy
- Vol. 155 (2) , 169-182
- https://doi.org/10.1111/j.1365-2818.1989.tb02880.x
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Operation modes of electron spectroscopic imaging and electron energy-loss spectroscopy in a transmission electron microscopeUltramicroscopy, 1988
- Top-bottom effect in energy-selecting transmission electron microscopyUltramicroscopy, 1987
- Zero-loss electron microscopy with the Zeiss EM902Ultramicroscopy, 1987
- Electron scattering in ice and organic materialsJournal of Microscopy, 1982
- High-resolution microanalysis of biological specimens by electron energy loss spectroscopy and by electron spectroscopic imagingJournal of Ultrastructure Research, 1980
- Measurement of inelastic/elastic scattering ratio for fast electrons and its use in the study of radiation damagePhysica Status Solidi (a), 1976
- Superposition of chromatic error and beam broadening in transmission electron microscopy of thick carbon and organic specimensUltramicroscopy, 1975
- Measurement of the top bottom effect in scanning transmission electron microscopy of thick amorphous specimensJournal of Microscopy, 1974
- The Mean Free Path of Relativistic Electrons for Plasmon ExcitationPhysica Status Solidi (b), 1970
- Contributions to the quantitative interpretation of electron microscope picturesExperimental Cell Research, 1957