A submicron precision silicon telescope for beam test purposes
- 1 April 1996
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 372 (3) , 379-384
- https://doi.org/10.1016/0168-9002(95)01414-4
Abstract
No abstract availableKeywords
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