Mechanism of thin-film electroluminescence
- 1 May 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 30 (5) , 448-452
- https://doi.org/10.1109/t-ed.1983.21145
Abstract
Experimental and theoretical evaluations of cross sections for hot carrier collisional excitation of manganese and rare-earth dopants in thin-film electroluminescent devices are reported. The hot carriers are identified experimentally as electrons. Energies of the hot electrons are estimated, and possibilities for improvements in efficiency are discussed.Keywords
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