Dislocation Content of Micropipes in SiC
- 26 January 1998
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 80 (4) , 740-741
- https://doi.org/10.1103/physrevlett.80.740
Abstract
Silicon carbide, a potentially powerful device material, suffers from microscopic hollow defects called micropipes. Their nature is not satisfactorily clarified yet. Our analysis shows that they are hollow core dislocations according to Frank's model, but contain dislocations of mixed type.Keywords
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