Extended Fine Structure on the Carbon Core-Ionization Edge Obtained from Nanometer-Sized Areas with Electron-Energy-Loss Spectroscopy
- 2 April 1979
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 42 (14) , 893-897
- https://doi.org/10.1103/physrevlett.42.893
Abstract
Extended fine structure, equivalent to extended x-ray-absorption fine structure, has been observed on carbon -ionization edges obtained with electron energy-loss spectroscopy utilizing 0.75- to 5-nm radius probe sizes, and sampling as few as atoms in times as short as 4 min. Radial distribution functions show the expected behavior for graphite and an amorphous carbon sample. A second "amorphous" sample, however, shows structure which suggests the existence of local tetrahedral coordination.
Keywords
This publication has 12 references indexed in Scilit:
- Extended X-Ray-Absorption Fine Structure of Surface Atoms on Single-Crystal Substrates: Iodine Adsorbed on Ag(111)Physical Review Letters, 1978
- CarbonEdge in Graphite Measured Using Electron-Energy-Loss SpectroscopyPhysical Review Letters, 1978
- New method for the calculation of atomic phase shifts: Application to extended x-ray absorption fine structure (EXAFS) in molecules and crystalsPhysical Review B, 1977
- Extended fine structure above the X-ray edge in electron energy loss spectraJournal of Physics D: Applied Physics, 1976
- Electron energy loss spectra of diamond, graphite and amorphous carbonJournal of Electron Spectroscopy and Related Phenomena, 1974
- Theory of the extended x-ray-absorption fine structurePhysical Review B, 1974
- Simple Calculation ofAbsorption Spectra of Na, Al, and SiPhysical Review Letters, 1974
- Interaction of 25 keV Electrons with the Nucleic Acid Bases, Adenine, Thymine, and Uracil. II. Inner Shell Excitation and Inelastic Scattering Cross SectionsThe Journal of Chemical Physics, 1972
- Diffusion inelastique des electrons dans un solide par excitation de niveaux atomiques profondsPhilosophical Magazine, 1972
- A Simple Scanning Electron MicroscopeReview of Scientific Instruments, 1969