Selection of a thresholding scheme for on-line quality inspection
- 1 October 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Canadian Electrical Engineering Journal
- Vol. 8 (4) , 130-134
- https://doi.org/10.1109/ceej.1983.6591840
Abstract
Thresholding of a given image into a binary one is a necessary step for most image analysis techniques. Different thresholding techniques have been proposed in the literature to achieve this goal. In this work the authors investigate some of the available techniques, and examine their suitability for industrial applications, such as on-line quality inspection. Single and multi-level thresholding schemes are applied to images of industrial parts and the results are presented. In addition, examples are given to show how the defects can be detected using image processing techniques.Keywords
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